Thomas-Fermi Screening in Graphene

dc.creatorSalis, M.
dc.date2007-01-05
dc.date2007-01-23
dc.date.accessioned2026-07-07T07:42:15Z
dc.date.available2026-07-07T07:42:15Z
dc.descriptionThe in-plane static screening of the field originated by a charge placed in a graphene sheet is investigated. A self-consistent field equation in the real space domain is obtained by using a suitable Thomas-Fermi procedure. Exact and approximated (for qualitative considerations) solutions are presented. In the case of a charged sheet, the screened potential presents a tail dependent on the free carrier density whose importance is connected with the local features of the impurity system. Early conclusions about Thomas-Fermi screening in graphene are revised.
dc.identifierhttps://arxiv.org/abs/cond-mat/0701108
dc.identifierhttp://arxiv.org/abs/cond-mat/0701108
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/122378
dc.subjectOther Condensed Matter
dc.titleThomas-Fermi Screening in Graphene
dc.typetext

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