Ab initio shallow acceptor levels in gallium nitride

dc.creatorFiorentini, V.
dc.creatorBernardini, F.
dc.creatorBosin, A.
dc.creatorVanderbilt, D.
dc.date1996-10-07
dc.date.accessioned2026-07-07T09:11:12Z
dc.date.available2026-07-07T09:11:12Z
dc.descriptionImpurity levels and formation energies of acceptors in wurtzite GaN are predicted ab initio. Be_Ga is found to be the shallow (thermal ionization energy $\sim$ 0.06 eV); $Mg_{Ga}$ and $Zn_{Ga}$ are mid-deep acceptors (0.23 eV and 0.33 eV respectively); $Ca_{Ga}$ and $Cd_{Ga}$ are deep acceptors ($\sim$0.65 eV); $Si_N$ is a midgap trap with high formation energy; finally, contrary to recent claims, $C_N$ is a deep acceptor (0.65 eV). Interstitials and heteroantisites are energetically not competitive with substitutional incorporation.
dc.description4 pages, to appear in "The Physics of Semiconductors"
dc.identifierhttps://arxiv.org/abs/cond-mat/9610045
dc.identifierhttp://arxiv.org/abs/cond-mat/9610045
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/151597
dc.subjectMaterials Science
dc.titleAb initio shallow acceptor levels in gallium nitride
dc.typetext

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