Supersensitive avalanche silicon drift photodetector

dc.creatorSadygov, Z. Ya.
dc.creatorSuleimanov, M. K.
dc.creatorBokova, T. Yu.
dc.date1999-09-10
dc.date.accessioned2026-07-07T03:38:05Z
dc.date.available2026-07-07T03:38:05Z
dc.descriptionPhysical principles of performance and main characteristics of a novel avalanche photodetector developed on the basis of MOS(metal-oxide-silicon) technology is presented. The photodetector contains a semitransparent gate electrode and a drain contact to provide a drift of multiplicated charge carriers along the semiconductor surface. A high gain(more than 10^4) of photocurrent was achived due to the local negative feedback effect realizied on the Si-SiO_2 boundary. Special attention is paid to the possibilities of development of a supersensitive avalanche CCD (charge coupled device) for detection of individual photons in visible and ultraviolet spectral regions. Experimental results obtained with a two-element CCD prototype are discussed.
dc.description3 pages
dc.identifierhttps://arxiv.org/abs/hep-ex/9909017
dc.identifierhttp://arxiv.org/abs/hep-ex/9909017
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/38379
dc.subjectHigh Energy Physics - Experiment
dc.titleSupersensitive avalanche silicon drift photodetector
dc.typetext

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