Double-tip STM for Surface Analysis

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dc.creatorNiu, Q.
dc.creatorChang, M. C.
dc.creatorShih, C. K.
dc.date1994-05-13
dc.date1994-12-26
dc.date.accessioned2026-07-07T08:58:50Z
dc.date.available2026-07-07T08:58:50Z
dc.descriptionWe explore the possibility of using a double-tip STM to probe the single electron Green function of a sample surface, and describe a few important applications: (1) Probing constant energy surfaces in $\k$-space by ballistic transport; (2) Measuring scattering phase shifts of defects; (3) Observing the transition from ballistic to diffusive transport to localization; and (4) Measuring inelastic mean free paths.
dc.descriptionMinor changes, to appear in Phys.Rev.B, 12 pages + 2 figures
dc.identifierhttps://arxiv.org/abs/cond-mat/9405036
dc.identifierhttp://arxiv.org/abs/cond-mat/9405036
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/147483
dc.subjectCondensed Matter
dc.titleDouble-tip STM for Surface Analysis
dc.typetext

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