Ionization and charge migration through strong internal fields in clusters exposed to intense X-ray pulses

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dc.creatorGnodtke, Christian
dc.creatorSaalmann, Ulf
dc.creatorRost, Jan M.
dc.date2009-02-23
dc.date.accessioned2026-07-07T13:09:48Z
dc.date.available2026-07-07T13:09:48Z
dc.descriptionA general scenario for electronic charge migration in finite samples illuminated by an intense laser pulse is given. Microscopic calculations for neon clusters under strong short pulses as produced by X-ray free-electron laser sources confirm this scenario and point to the prominent role of field ionization by strong internal fields. The latter leads to the fast formation of a core-shell system with an almost static core of screened ions while the outer shell explodes. Substituting the shell ions with a different material such as helium as a sacrificial layer leads to a substantial improvement of the diffraction image for the embedded cluster thus reducing the consequences of radiation damage for coherent diffractive imaging.
dc.description5 pages, 4 figures
dc.identifierhttps://arxiv.org/abs/0902.3940
dc.identifierhttp://arxiv.org/abs/0902.3940
dc.identifierPhys. Rev. A 79, 041201 (2009)
dc.identifierdoi:10.1103/PhysRevA.79.041201
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/228856
dc.subjectAtomic and Molecular Clusters
dc.titleIonization and charge migration through strong internal fields in clusters exposed to intense X-ray pulses
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