Consequences of the background in piezoresponse force microscopy on the imaging of ferroelectric domain structures

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dc.creatorJungk, T.
dc.creatorHoffmann, A.
dc.creatorSoergel, E.
dc.date2005-12-16
dc.date2007-05-26
dc.date.accessioned2026-07-07T08:22:39Z
dc.date.available2026-07-07T08:22:39Z
dc.descriptionThe interpretation of ferroelectric domain images obtained with piezoresponse force microscopy (PFM) is discussed. The influences of an inherent experimental background on the domain contrast in PFM images (enhancement, nulling, inversion) as well as on the shape and the location of the domain boundaries are described. We present experimental results to evidence our analysis of the influence of the background on the domain contrast in PFM images.
dc.identifierhttps://arxiv.org/abs/cond-mat/0512373
dc.identifierhttp://arxiv.org/abs/cond-mat/0512373
dc.identifierJ. Microsc.-Oxford 227, 76-82 (2007)
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/135723
dc.subjectMaterials Science
dc.titleConsequences of the background in piezoresponse force microscopy on the imaging of ferroelectric domain structures
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