Measurement of the trapping lifetime close to a cold metallic surface on a cryogenic atom-chip

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dc.creatorEmmert, Andreas
dc.creatorLupascu, Adrian
dc.creatorNogues, Gilles
dc.creatorBrune, Michel
dc.creatorRaimond, Jean-Michel
dc.creatorHaroche, Serge
dc.date2009-01-27
dc.date.accessioned2026-07-07T12:35:30Z
dc.date.available2026-07-07T12:35:30Z
dc.descriptionWe have measured the trapping lifetime of magnetically trapped atoms in a cryogenic atom-chip experiment. An ultracold atomic cloud is kept at a fixed distance from a thin gold layer deposited on top of a superconducting trapping wire. The lifetime is studied as a function of the distances to the surface and to the wire. Different regimes are observed, where loss rate is determined either by the technical current noise in the wire or the Johnson-Nyquist noise in the metallic gold layer, in good agreement with theoretical predictions. Far from the surface, we observe exceptionally long trapping times for an atom-chip, in the 10-minutes range.
dc.description5 pages
dc.identifierhttps://arxiv.org/abs/0901.4331
dc.identifierhttp://arxiv.org/abs/0901.4331
dc.identifierEuropean Physical Journal D 51 (2009) 173-177
dc.identifierdoi:10.1140/epjd/e2009-00001-5
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/217786
dc.subjectAtomic Physics
dc.titleMeasurement of the trapping lifetime close to a cold metallic surface on a cryogenic atom-chip
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