Randomized benchmarking and process tomography for gate errors in a solid-state qubit

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dc.creatorChow, J. M.
dc.creatorGambetta, J. M.
dc.creatorTornberg, L.
dc.creatorKoch, Jens
dc.creatorBishop, Lev S.
dc.creatorHouck, A. A.
dc.creatorJohnson, B. R.
dc.creatorFrunzio, L.
dc.creatorGirvin, S. M.
dc.creatorSchoelkopf, R. J.
dc.date2008-11-26
dc.date.accessioned2026-07-07T12:49:32Z
dc.date.available2026-07-07T12:49:32Z
dc.descriptionWe present measurements of single-qubit gate errors for a superconducting qubit. Results from quantum process tomography and randomized benchmarking are compared with gate errors obtained from a double pi pulse experiment. Randomized benchmarking reveals a minimum average gate error of 1.1+/-0.3% and a simple exponential dependence of fidelity on the number of gates. It shows that the limits on gate fidelity are primarily imposed by qubit decoherence, in agreement with theory.
dc.description4 pages, 4 figures, plus supplementary material
dc.identifierhttps://arxiv.org/abs/0811.4387
dc.identifierhttp://arxiv.org/abs/0811.4387
dc.identifierPhys. Rev. Lett. 102, 090502 (2009)
dc.identifierdoi:10.1103/PhysRevLett.102.090502
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/222437
dc.subjectMesoscale and Nanoscale Physics
dc.subjectSuperconductivity
dc.subjectQuantum Physics
dc.titleRandomized benchmarking and process tomography for gate errors in a solid-state qubit
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