Width distribution of contact lines on a disordered substrate

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dc.creatorMoulinet, Sebastien
dc.creatorRosso, Alberto
dc.creatorKrauth, Werner
dc.creatorRolley, Etienne
dc.date2003-10-08
dc.date.accessioned2026-07-07T02:54:03Z
dc.date.available2026-07-07T02:54:03Z
dc.descriptionWe have studied the roughness of a contact line of a liquid meniscus on a disordered substrate by measuring its width distribution. The comparison between the measured width distribution and the width distribution calculated in previous works, extended here to the case of open boundary conditions, confirms that the Joanny-de Gennes model is not sufficient to describe the dynamics of contact lines at the depinning threshold. This conclusion is in agreement with recent measurements which determine the roughness exponent by extrapolation to large system sizes.
dc.description4 pages, 3 figures
dc.identifierhttps://arxiv.org/abs/cond-mat/0310173
dc.identifierhttp://arxiv.org/abs/cond-mat/0310173
dc.identifierPhys. Rev. E 69, 035103(R) (2004)
dc.identifierdoi:10.1103/PhysRevE.69.035103
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/22394
dc.subjectDisordered Systems and Neural Networks
dc.titleWidth distribution of contact lines on a disordered substrate
dc.typetext

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