Scanning tunneling spectroscopy characterization of the pseudogap and the x = 1/8 anomaly in La2-xSrxCuO4 thin films

dc.creatorYuli, Ofer
dc.creatorAsulin, Itay
dc.creatorKoren, Gad
dc.creatorMillo, Oded
dc.date2007-07-04
dc.date.accessioned2026-07-07T08:13:55Z
dc.date.available2026-07-07T08:13:55Z
dc.descriptionUsing scanning tunneling spectroscopy we examined the local density of states of thin c-axis La2-xSrxCuO4 films, over wide doping and temperature ranges. We found that the pseudogap exists only at doping levels lower than optimal. For x = 0.12, close to the 'anomalous' x = 1/8 doping level, a zero bias conductance peak was the dominant spectral feature, instead of the excepted V- shaped (c-axis tunneling) gap structure. We have established that this surprising effect cannot be explained by tunneling into (110) facets. Possible origins for this unique behavior are discussed.
dc.description15 pages, 6 figures
dc.identifierhttps://arxiv.org/abs/0707.0551
dc.identifierhttp://arxiv.org/abs/0707.0551
dc.identifierPhysical Review B 75, 184521 (2007)
dc.identifierdoi:10.1103/PhysRevB.75.184521
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/132940
dc.subjectSuperconductivity
dc.subjectStrongly Correlated Electrons
dc.titleScanning tunneling spectroscopy characterization of the pseudogap and the x = 1/8 anomaly in La2-xSrxCuO4 thin films
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