Critical Thickness in Dewetting Films
| dc.creator | Du, B. | |
| dc.creator | Yang, Z. | |
| dc.creator | Tsui, O. K. C. | |
| dc.date | 2001-10-06 | |
| dc.date.accessioned | 2026-07-07T02:42:56Z | |
| dc.date.available | 2026-07-07T02:42:56Z | |
| dc.description | We study dewetting of thin polymer films with built-in topographical fluctuations produced by rubbing the film surface with a rayon cloth. By varying the density of imposed surface defects, we unambiguously distinguish spinodal dewetting, which dominates in liquid films thinner than a characteristic thickness = 13.3 nm, from heterogeneous nucleation in the thicker films. Invariance of this characteristic thickness upon more than a decade change in the defect density makes kinetic effect an unseemly origin. A crossover of the spinodal line provides a consistent picture. This interpretation, however, contends the current understanding of molecular interactions in apolar liquid films. | |
| dc.description | 10 pages, 2 plots, 3 images in jpg | |
| dc.identifier | https://arxiv.org/abs/cond-mat/0110123 | |
| dc.identifier | http://arxiv.org/abs/cond-mat/0110123 | |
| dc.identifier.uri | http://salesiana.dossiersoluciones.com/handle/123456789/18347 | |
| dc.subject | Soft Condensed Matter | |
| dc.title | Critical Thickness in Dewetting Films | |
| dc.type | text |