Limit on the Addressability of Fault-Tolerant Nanowire Decoders

dc.creatorChee, Yeow Meng
dc.creatorLing, Alan C. H.
dc.date2009-01-29
dc.date.accessioned2026-07-07T12:35:37Z
dc.date.available2026-07-07T12:35:37Z
dc.descriptionAlthough prone to fabrication error, the nanowire crossbar is a promising candidate component for next generation nanometer-scale circuits. In the nanowire crossbar architecture, nanowires are addressed by controlling voltages on the mesowires. For area efficiency, we are interested in the maximum number of nanowires $N(m,e)$ that can be addressed by $m$ mesowires, in the face of up to $e$ fabrication errors. Asymptotically tight bounds on $N(m,e)$ are established in this paper. In particular, it is shown that $N(m,e) = Θ(2^m / m^{e+1/2})$. Interesting observations are made on the equivalence between this problem and the problem of constructing optimal EC/AUED codes, superimposed distance codes, pooling designs, and diffbounded set systems. Results in this paper also improve upon those in the EC/AUEC codes literature.
dc.description9 pages, 4 figures
dc.identifierhttps://arxiv.org/abs/0901.4694
dc.identifierhttp://arxiv.org/abs/0901.4694
dc.identifierIEEE Transactions on Computers, vol. 58, no. 1, pp. 60-68, 2009
dc.identifierdoi:10.1109/TC.2008.130
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/217822
dc.subjectHardware Architecture
dc.subjectDiscrete Mathematics
dc.subjectInformation Theory
dc.titleLimit on the Addressability of Fault-Tolerant Nanowire Decoders
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