Measurement of quantum devices

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dc.creatorFiurasek, Jaromir
dc.creatorHradil, Zdenek
dc.date2000-09-29
dc.date.accessioned2026-07-07T06:00:54Z
dc.date.available2026-07-07T06:00:54Z
dc.descriptionMaximum-likelihood estimation is applied to identification of an unknown quantum mechanical process represented by a ``black box''. In contrast to linear reconstruction schemes the proposed approach always yields physically sensible results. Its feasibility is demonstrated using the Monte Carlo simulations for the two-level system (single qubit).
dc.descriptionREVTeX, 4 pages
dc.identifierhttps://arxiv.org/abs/quant-ph/0009123
dc.identifierhttp://arxiv.org/abs/quant-ph/0009123
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/89103
dc.subjectQuantum Physics
dc.titleMeasurement of quantum devices
dc.typetext

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