Localization and test exponents for tight closure

dc.creatorHochster, Melvin
dc.creatorHuneke, Craig
dc.date2002-11-11
dc.date.accessioned2026-07-07T04:52:50Z
dc.date.available2026-07-07T04:52:50Z
dc.descriptionIn this paper we study various equivalent conditions for tight closure to commute with localization. If N is a submodule of a finitely generated module M over a Noetherian commutative ring of characteristic p, then a test exponent for c,N,M is defined to be a power q' of p such that u is in the tight closure of N in M whenever cu^q is in the qth Frobenius power of N for some q \ge q'. We prove that that a test exponent for a locally stable test element c and for N,M as above exists if and only if the tight closure of N in M commutes with localization. Other equivalent conditions are given for tight closure to commute with localization.
dc.identifierhttps://arxiv.org/abs/math/0211173
dc.identifierhttp://arxiv.org/abs/math/0211173
dc.identifierMichigan Math. J. 48 (2000), 305--329
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/65615
dc.subjectCommutative Algebra
dc.subject13A35 (13B30 13D40)
dc.titleLocalization and test exponents for tight closure
dc.typetext

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