XMCD characterization of rare-earth dopants in Ni$_{81}$Fe$_{19}$(50nm): microscopic basis of engineered damping

dc.creatorBailey, W. E.
dc.creatorCheng, L.
dc.creatorSong, H.
dc.date2004-03-25
dc.date.accessioned2026-07-07T02:57:15Z
dc.date.available2026-07-07T02:57:15Z
dc.descriptionWe present direct evidence for the contribution of local orbital moments to the damping of magnetization precession in magnetic thin films. Using x-ray magnetic circular dichroism (XMCD) characterization of rare-earth (RE) M$_{4,5}$ edges in Ni$_{81}$Fe$_{19}$ doped with $<$ 2% Gd and Tb, we show that the enhancement of GHz precessional relaxation is accompanied by a significant orbital moment fraction on the RE site. Tb impurities, which enhance the Landau-Lifshitz(-Gilbert) LL(-G) damping $λ(α)$, show a spin to orbital number ratio of 1.5$\pm$0.3; Gd impurities, which have no effect on damping, show a spin to orbital number ratio of zero within experimental error. The results indicate that the dopant-based control of magnetization damping in RE-doped ferromagnets is an atomistic effect, arising from spin-lattice coupling, and thus scalable to nanometer dimensions.
dc.description4 pages, 2 figures
dc.identifierhttps://arxiv.org/abs/cond-mat/0403627
dc.identifierhttp://arxiv.org/abs/cond-mat/0403627
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/23595
dc.subjectMaterials Science
dc.titleXMCD characterization of rare-earth dopants in Ni$_{81}$Fe$_{19}$(50nm): microscopic basis of engineered damping
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