Simultaneous current-, force- and work function measurement with atomic resolution

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dc.creatorHerz, M.
dc.creatorSchiller, Ch.
dc.creatorGiessibl, F. J.
dc.creatorMannhart, J.
dc.date2005-01-19
dc.date.accessioned2026-07-07T03:03:21Z
dc.date.available2026-07-07T03:03:21Z
dc.descriptionThe local work function of a surface determines the spatial decay of the charge density at the Fermi level normal to the surface. Here, we present a method that enables simultaneous measurements of local work function and tip-sample forces. A combined dynamic scanning tunneling microscope and atomic force microscope is used to measure the tunneling current between an oscillating tip and the sample in real time as a function of the cantilever's deflection. Atomically resolved work function measurements on a silicon (111)-($7\times 7$) surface are presented and related to concurrently recorded tunneling current- and force- measurements.
dc.description8 pages, 4 figures, submitted to Applied Physics Letters
dc.identifierhttps://arxiv.org/abs/cond-mat/0501469
dc.identifierhttp://arxiv.org/abs/cond-mat/0501469
dc.identifierAppl. Phys. Lett. 86, 153101 (2005)
dc.identifierdoi:10.1063/1.1900316
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/25717
dc.subjectMaterials Science
dc.titleSimultaneous current-, force- and work function measurement with atomic resolution
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