Electronic Hong-Ou-Mandel interferometer for multi-mode entanglement detection

dc.creatorGiovannetti, Vittorio
dc.creatorFrustaglia, Diego
dc.creatorTaddei, Fabio
dc.creatorFazio, Rosario
dc.date2006-06-15
dc.date2008-02-18
dc.date.accessioned2026-07-07T09:21:16Z
dc.date.available2026-07-07T09:21:16Z
dc.descriptionWe show that multi-mode entanglement of electrons in a mesoscopic conductor can be detected by a measurement of the zero-frequency current correlations in an electronic Hong-Ou-Mandel interferometer. By this mean, one can further establish a lower bound to the entanglement of formation of two-electron input states. Our results extend the work of Burkard and Loss [Phys. Rev. Lett. 91, 087903 (2003)] to many channels and provide a way to test the existence of entangled states involving both orbital and spin degrees of freedom.
dc.description6 pages. Revised version. Ref. added
dc.identifierhttps://arxiv.org/abs/cond-mat/0606413
dc.identifierhttp://arxiv.org/abs/cond-mat/0606413
dc.identifierPhys. Rev. B 74, 115315 (2006)
dc.identifierdoi:10.1103/PhysRevB.74.115315
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/154963
dc.subjectMesoscale and Nanoscale Physics
dc.subjectQuantum Physics
dc.titleElectronic Hong-Ou-Mandel interferometer for multi-mode entanglement detection
dc.typetext

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