Quasi-Optical Characterization of Dielectric and Ferrite Materials

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dc.creatorGoy, Philippe
dc.creatorCaroopen, Sylvain
dc.creatorGross, Michel
dc.date2009-04-20
dc.date.accessioned2026-07-07T13:06:21Z
dc.date.available2026-07-07T13:06:21Z
dc.descriptionQuasi-Optical Characterization of Dielectric and Ferrite Materials are made in the millimeter-submillimeter range by using a Quasi-Optical (QO) benches that can be relatively compact, typically of the order 10cm wide and 1m long.
dc.description17th International Symposium on Space THz Technology, Paris : France (2006)
dc.identifierhttps://arxiv.org/abs/0904.3069
dc.identifierhttp://arxiv.org/abs/0904.3069
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/227758
dc.subjectOptics
dc.subjectInstrumentation and Detectors
dc.titleQuasi-Optical Characterization of Dielectric and Ferrite Materials
dc.typetext

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