Rayleigh Imaging of Graphene and Graphene Layers

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dc.creatorCasiraghi, C.
dc.creatorHartschuh, A.
dc.creatorLidorikis, E.
dc.creatorQian, H.
dc.creatorHarutyunyan, H.
dc.creatorGokus, T.
dc.creatorNovoselov, K. S.
dc.creatorFerrari, A. C.
dc.date2007-05-18
dc.date.accessioned2026-07-07T08:52:28Z
dc.date.available2026-07-07T08:52:28Z
dc.descriptionWe investigate graphene and graphene layers on different substrates by monochromatic and white-light confocal Rayleigh scattering microscopy. The image contrast depends sensitively on the dielectric properties of the sample as well as the substrate geometry and can be described quantitatively using the complex refractive index of bulk graphite. For few layers (<6) the monochromatic contrast increases linearly with thickness: the samples behave as a superposition of single sheets which act as independent two dimensional electron gases. Thus, Rayleigh imaging is a general, simple and quick tool to identify graphene layers, that is readily combined with Raman scattering, which provides structural identification.
dc.description8 pages, 9 figures
dc.identifierhttps://arxiv.org/abs/0705.2645
dc.identifierhttp://arxiv.org/abs/0705.2645
dc.identifierNano Lett. 7, 2711 (2007)
dc.identifierdoi:10.1021/nl071168m
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/145286
dc.subjectMaterials Science
dc.titleRayleigh Imaging of Graphene and Graphene Layers
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