Noninvasive measurement of micron electron beam size of high energy using diffraction radiation
| dc.creator | Naumenko, G. | |
| dc.date | 2003-05-05 | |
| dc.date | 2004-05-31 | |
| dc.date.accessioned | 2026-07-07T03:35:45Z | |
| dc.date.available | 2026-07-07T03:35:45Z | |
| dc.description | Treatments of the usage of optical diffraction radiation from the relativistic electrons moving though a conductive slit for the noninvasive transverse beam size measurement encounter hard limitation of the method sensitivity for the electron energy larger than 1 GeV. We consider in this article a possibility of application in a diffraction radiation technique the artificial phase shift, which can take place when transverse electron position varies. This allows us to realize the nonivasive measurements of transverse size of supper-relativistic electron beams with the small emittance. | |
| dc.description | 6 pages, 6 figures | |
| dc.identifier | https://arxiv.org/abs/hep-ex/0305004 | |
| dc.identifier | http://arxiv.org/abs/hep-ex/0305004 | |
| dc.identifier.uri | http://salesiana.dossiersoluciones.com/handle/123456789/37475 | |
| dc.subject | High Energy Physics - Experiment | |
| dc.title | Noninvasive measurement of micron electron beam size of high energy using diffraction radiation | |
| dc.type | text |