Measurement of single electron emission in two-phase xenon

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dc.creatorEdwards, B.
dc.creatorAraujo, H. M.
dc.creatorChepel, V.
dc.creatorCline, D.
dc.creatorDurkin, T.
dc.creatorGao, J.
dc.creatorGhag, C.
dc.creatorKorolkova, E. V.
dc.creatorLebedenko, V. N.
dc.creatorLindote, A.
dc.creatorLopes, M. I.
dc.creatorLuscher, R.
dc.creatorMurphy, A. St. J.
dc.creatorNeves, F.
dc.creatorOoi, W.
dc.creatorda Cunha, J. Pinto
dc.creatorPreece, R. M.
dc.creatorSalinas, G.
dc.creatorSilva, C.
dc.creatorSolovov, V. N.
dc.creatorSmith, N. J. T.
dc.creatorSmith, P. F.
dc.creatorSumner, T. J.
dc.creatorThorne, C.
dc.creatorWalker, R. J.
dc.creatorWang, H.
dc.creatorWhite, J. T.
dc.creatorWolfs, F. L. H.
dc.date2007-08-06
dc.date.accessioned2026-07-07T11:52:53Z
dc.date.available2026-07-07T11:52:53Z
dc.descriptionWe present the first measurements of the electroluminescence response to the emission of single electrons in a two-phase noble gas detector. Single ionization electrons generated in liquid xenon are detected in a thin gas layer during the 31-day background run of the ZEPLIN-II experiment, a two-phase xenon detector for WIMP dark matter searches. Both the pressure dependence and magnitude of the single-electron response are in agreement with previous measurements of electroluminescence yield in xenon. We discuss different photoionization processes as possible cause for the sample of single electrons studied in this work. This observation may have implications for the design and operation of future large-scale two-phase systems.
dc.description11 pages, 6 figures
dc.identifierhttps://arxiv.org/abs/0708.0768
dc.identifierhttp://arxiv.org/abs/0708.0768
dc.identifierAstropart.Phys.30:54-57,2008
dc.identifierdoi:10.1016/j.astropartphys.2008.06.006
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/204342
dc.subjectInstrumentation and Detectors
dc.titleMeasurement of single electron emission in two-phase xenon
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