Frequency dispersion of photon-assisted shot noise in mesoscopic conductors

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dc.creatorBagrets, D.
dc.creatorPistolesi, F.
dc.date2006-06-29
dc.date.accessioned2026-07-07T08:56:53Z
dc.date.available2026-07-07T08:56:53Z
dc.descriptionWe calculate the low-frequency current noise for AC biased mesoscopic chaotic cavities and diffusive wires. Contrary to what happens for the admittance, the frequency dispersion is not dominated by the electric response time (the "RC" time of the circuit), but by the time that electrons need to diffuse through the structure (dwell time or diffusion time). Frequency dispersion of noise stems from fluctuations of the Fermi distribution function that preserve charge neutrality. Our predictions can be verified with present experimental technology.
dc.description5 pages, 3 Figures
dc.identifierhttps://arxiv.org/abs/cond-mat/0606775
dc.identifierhttp://arxiv.org/abs/cond-mat/0606775
dc.identifierPhys. Rev. B vol. 75, 165315 (2007).
dc.identifierdoi:10.1103/PhysRevB.75.165315
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/146775
dc.subjectMesoscale and Nanoscale Physics
dc.subjectStatistical Mechanics
dc.titleFrequency dispersion of photon-assisted shot noise in mesoscopic conductors
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