Digital Processing in Tunneling Spectroscopy

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dc.creatorDizhur, E. M.
dc.creatorFedorov, A. V.
dc.date2004-08-10
dc.date2004-08-13
dc.date.accessioned2026-07-07T02:59:39Z
dc.date.available2026-07-07T02:59:39Z
dc.descriptionAn alternative approach to detect very weak singularities on the characteristics of a tunnel diode is proposed in which the numerical differential filtering is applied directly to measured current versus voltage dependence instead of the modulation technique commonly used with this purpose. The gains and looses of the both approaches in the particular case of tunneling investigations of semiconductors under pressure are discussed. The corresponding circuitry and mathematical routines are presented.
dc.description5 pages, 4 figures
dc.identifierhttps://arxiv.org/abs/cond-mat/0408206
dc.identifierhttp://arxiv.org/abs/cond-mat/0408206
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/24592
dc.subjectOther Condensed Matter
dc.subjectStrongly Correlated Electrons
dc.titleDigital Processing in Tunneling Spectroscopy
dc.typetext

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