Spin Lifetimes in Quantum Dots from Noise Measurements

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dc.creatorWabnig, J.
dc.creatorLovett, B. W.
dc.creatorJefferson, J. H.
dc.creatorBriggs, G. A. D.
dc.date2008-04-04
dc.date2008-08-22
dc.date.accessioned2026-07-07T12:27:51Z
dc.date.available2026-07-07T12:27:51Z
dc.descriptionWe present a method of obtaining information about spin lifetimes in quantum dots from measurements of electrical transport. The dot is under resonant microwave irradiation and at temperatures comparable to or larger than the Zeeman energy. We find that the ratio of the spin coherence times T_{1}/T_{2} can be deduced from a measurement of current through the quantum dot as a function the applied magnetic field. We calculate the noise power spectrum of the dot current and show that a dip occurs at the Rabi frequency with a line width given by 1/T_{1}+1/T_{2}.
dc.description4 Pages, 4 figures
dc.identifierhttps://arxiv.org/abs/0804.0771
dc.identifierhttp://arxiv.org/abs/0804.0771
dc.identifierPhys. Rev. Lett. 102, 016802 (2009).
dc.identifierdoi:10.1103/PhysRevLett.102.016802
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/215349
dc.subjectMesoscale and Nanoscale Physics
dc.subjectQuantum Physics
dc.titleSpin Lifetimes in Quantum Dots from Noise Measurements
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