Reply to the Comment on ``Charged impurity scattering limited low temperature resistivity of low density silicon inversion layers''

2026-07-072026-07-07http://salesiana.dossiersoluciones.com/handle/123456789/28975This is a Reply to the Comment (cond-mat/9812331) by Kravchenko et al. on our earlier work (cond-mat/9812216).3 pages, 1 figureStrongly Correlated ElectronsDisordered Systems and Neural NetworksReply to the Comment on ``Charged impurity scattering limited low temperature resistivity of low density silicon inversion layers''text