2026-07-072026-07-07http://salesiana.dossiersoluciones.com/handle/123456789/196432We present recent beam data from a new design of a profile monitor for proton beams at Fermilab. The monitors, consisting of grids of segmented Ti foils 5micrometers thick, are secondary-electron emission monitors (SEM's). We review data on the device's precision on beam centroid position, beam width, and on beam loss associated with the SEM material placed in the beam.paper RPAT044 accepted to Proc. 2005 Particle Accelerator ConferenceInstrumentation and DetectorsHigh Energy Physics - ExperimentAccelerator Physicstext