2026-07-072026-07-07http://salesiana.dossiersoluciones.com/handle/123456789/157001An atomic force microscope is used to structure a film of multilayer graphene. The resistance of the sample was measured in-situ during nanomachining narrow trenches. We found a reversible behavior in the electrical resistance which we attribute to the movement of dislocations. After several attempts also permanent changes are observed.Mesoscale and Nanoscale Physicstext