2026-07-072026-07-07http://salesiana.dossiersoluciones.com/handle/123456789/24608An exact analytical solution based on the method of images has been obtained for the description of the electrostatic field in the system comrising of atomic force microscope (AFM)tip, dielectric, and conductor. The solution provides a step towards quantitative modelling of AFM-assisted electrostatic nanolithography in polymers.6 pages 1 figureMaterials ScienceSoft Condensed Mattertext