2026-07-072026-07-07http://salesiana.dossiersoluciones.com/handle/123456789/155365Three-dimensional MEMS magnetometers with use of residual stresses in thin multilayers cantilevers are presented. Half-loop cantilevers based on Lorentz-force deflection convert magnetic flux in changes, thanks to piezoresistive transducers mounted in Wheatstone bridge. Magnetic field in the order of 10 Gauss was measured with a sensitivity of 0.015 mV/Gauss. A Finite Element Model of the device has been developed with Ansys for static and dynamic simulations. Novel out-of-plane ferromagnetic nickel plate magnetometer is also presented.Submitted on behalf of EDA Publishing Association (http://irevues.inist.fr/EDA-Publishing)Other Computer ScienceOut-of-Plane Cmos Compatible Magnetometerstext