2026-07-072026-07-07http://salesiana.dossiersoluciones.com/handle/123456789/157414The standard equations for semiconductor device analysis were solved by specifying the electron and hole current injected at a small contact, assuming high-level injection. Calculated current-voltage characteristics were fit to measurements of a single point breakdown in an ultrathin dielectric. It was found that the minority carrier injection level was about 70%.2 pages, 1 figure, 28th International Conference on the Physics of Semiconductors, Vienna, 24-28 July 2006Other Condensed Mattertext