2026-07-072026-07-07http://salesiana.dossiersoluciones.com/handle/123456789/145297We report strong variations in the Raman spectra for different single-layer graphene samples obtained by micromechanical cleavage, which reveals the presence of excess charges, even in the absence of intentional doping. Doping concentrations up to ~10^13 cm-2 are estimated from the G peak shift and width, and the variation of both position and relative intensity of the second order 2D peak. Asymmetric G peaks indicate charge inhomogeneity on the scale of less than 1 micron.3 pages, 5 figuresMaterials ScienceRaman Fingerprint of Charged Impurities in Graphenetext