2026-07-072026-07-07http://salesiana.dossiersoluciones.com/handle/123456789/19835We consider numerically the depinning transition in the random-field Ising model. Our analysis reveals that the three and four dimensional model displays a simple scaling behavior whereas the five dimensional scaling behavior is affected by logarithmic corrections. This suggests that d=5 is the upper critical dimension of the depinning transition in the random-field Ising model. Furthermore, we investigate the so-called creep regime (small driving fields and temperatures) where the interface velocity is given by an Arrhenius law.some misprints correctedStatistical Mechanicstext