2026-07-072026-07-07http://salesiana.dossiersoluciones.com/handle/123456789/114751A simple method for visualization of nonuniformity of planar MBE structures is proposed. The method is based on measuring the relief of the photo-EMF. The method can be applied to a wide variety of semiconductor structures and does not require any expensive equipment.2 pages, 2 figuresMaterials Sciencetext