2026-07-072026-07-07http://salesiana.dossiersoluciones.com/handle/123456789/26092A radically new approach to surface probing based on a replacement of the solid-state near-field probes by the 'long-field' ones is presented and discussed. Such probes may enable to create a radically new generation microscopes with non-perturbing long-range action probe based on a highly sensitive RF test method with a single-layer flat coil. This may give a start for creation of a new direction in microscopy.4 pages, 2 figures. Journal of Contemporary Physics (Armenian Academy of Sciences), 2005, submitted [to be published by Allerton Press, Inc.]Other Condensed Mattertext