2026-07-072026-07-07http://salesiana.dossiersoluciones.com/handle/123456789/139360We present a segregrated strain model that describes the thickness-dependent dielectric properties of ferroelectric films. Using a phenomenological Landau approach, we present results for two specific materials, making comparison with experiment and with first-principles calculations whenever possible. We also suggest a "smoking gun" benchtop probe to test our elastic scenario.13 pages, 17 figuresMaterials Sciencetext