2026-07-072026-07-07http://salesiana.dossiersoluciones.com/handle/123456789/37475Treatments of the usage of optical diffraction radiation from the relativistic electrons moving though a conductive slit for the noninvasive transverse beam size measurement encounter hard limitation of the method sensitivity for the electron energy larger than 1 GeV. We consider in this article a possibility of application in a diffraction radiation technique the artificial phase shift, which can take place when transverse electron position varies. This allows us to realize the nonivasive measurements of transverse size of supper-relativistic electron beams with the small emittance.6 pages, 6 figuresHigh Energy Physics - Experimenttext