Reply to the Comment on ``Charged impurity scattering limited low temperature resistivity of low density silicon inversion layers''

Thumbnail Image

Date

Authors

Journal Title

Journal ISSN

Volume Title

Publisher

Abstract

Description

This is a Reply to the Comment (cond-mat/9812331) by Kravchenko et al. on our earlier work (cond-mat/9812216).
3 pages, 1 figure

Keywords

Strongly Correlated Electrons, Disordered Systems and Neural Networks

Citation

URI

http://salesiana.dossiersoluciones.com/handle/123456789/28975

Consulte el texto completo en el siguiente enlace:

https://arxiv.org/abs/cond-mat/9901117
 http://arxiv.org/abs/cond-mat/9901117

Collections

arXiv