Nanolithography and manipulation of graphene using an atomic force microscope

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dc.creatorGiesbers, A. J. M.
dc.creatorZeitler, U.
dc.creatorNeubeck, S.
dc.creatorFreitag, F.
dc.creatorNovoselov, K. S.
dc.creatorMaan, J. C.
dc.date2008-06-04
dc.date2008-06-05
dc.date.accessioned2026-07-07T09:54:23Z
dc.date.available2026-07-07T09:54:23Z
dc.descriptionWe use an atomic force microscope (AFM) to manipulate graphene films on a nanoscopic length scale. By means of local anodic oxidation with an AFM we are able to structure isolating trenches into single-layer and few-layer graphene flakes, opening the possibility of tabletop graphene based device fabrication. Trench sizes of less than 30 nm in width are attainable with this technique. Besides oxidation we also show the influence of mechanical peeling and scratching with an AFM of few layer graphene sheets placed on different substrates.
dc.description11 pages text, 5 figures
dc.identifierhttps://arxiv.org/abs/0806.0716
dc.identifierhttp://arxiv.org/abs/0806.0716
dc.identifierSolid State Communications 147. 366-369 (2008)
dc.identifierdoi:10.1016/j.ssc.2008.06.027
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/166295
dc.subjectMesoscale and Nanoscale Physics
dc.titleNanolithography and manipulation of graphene using an atomic force microscope
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