The method of non-linear distortions elimination in photoacoustic investigation of layered semiconductor structure

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This paper presents the consideration of the presence and the influence of non-linear distortion of photo-acoustic measurement set-up on the results of thermal properties analysis for the multi-layer semiconductor structure. The authors propose a method which will eliminate such an influence.
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Materials Science

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http://salesiana.dossiersoluciones.com/handle/123456789/137863

Consulte el texto completo en el siguiente enlace:

https://arxiv.org/abs/0709.1870
 http://arxiv.org/abs/0709.1870
 Dans Proceedings of 12th International Workshop on Thermal investigations of ICs - THERMINIC 2006, Nice : France (2006)

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