The method of non-linear distortions elimination in photoacoustic investigation of layered semiconductor structure

Simple item page
dc.creatorSuszynski, Z.
dc.creatorDuer, R.
dc.creatorKosikowski, M.
dc.date2007-09-12
dc.date.accessioned2026-07-07T08:29:08Z
dc.date.available2026-07-07T08:29:08Z
dc.descriptionThis paper presents the consideration of the presence and the influence of non-linear distortion of photo-acoustic measurement set-up on the results of thermal properties analysis for the multi-layer semiconductor structure. The authors propose a method which will eliminate such an influence.
dc.descriptionSubmitted on behalf of TIMA Editions (http://irevues.inist.fr/tima-editions)
dc.identifierhttps://arxiv.org/abs/0709.1870
dc.identifierhttp://arxiv.org/abs/0709.1870
dc.identifierDans Proceedings of 12th International Workshop on Thermal investigations of ICs - THERMINIC 2006, Nice : France (2006)
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/137863
dc.subjectMaterials Science
dc.titleThe method of non-linear distortions elimination in photoacoustic investigation of layered semiconductor structure
dc.typetext

Files

Collections

arXiv