Rietveld refinement of ZrSiO4: application of a phenomenological model of anisotropic peak width

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The anisotropic broadening of ZrSiO4 sample is modelled using the Stephens's phenomenological model for anisotropic line broadening and the three dimensional strain distribution in the sample is plotted. The micro-structural parameters like domain size and dislocation density are estimated using the variance method.
Presented at European Powder Diffraction Conference (EPDIC 10), Geneva

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Materials Science

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http://salesiana.dossiersoluciones.com/handle/123456789/123740

Consulte el texto completo en el siguiente enlace:

https://arxiv.org/abs/cond-mat/0702262
 http://arxiv.org/abs/cond-mat/0702262

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arXiv