Rietveld refinement of ZrSiO4: application of a phenomenological model of anisotropic peak width

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dc.creatorSarkar, A.
dc.creatorMukherjee, P.
dc.creatorBarat, P.
dc.date2007-02-10
dc.date.accessioned2026-07-07T07:46:10Z
dc.date.available2026-07-07T07:46:10Z
dc.descriptionThe anisotropic broadening of ZrSiO4 sample is modelled using the Stephens's phenomenological model for anisotropic line broadening and the three dimensional strain distribution in the sample is plotted. The micro-structural parameters like domain size and dislocation density are estimated using the variance method.
dc.descriptionPresented at European Powder Diffraction Conference (EPDIC 10), Geneva
dc.identifierhttps://arxiv.org/abs/cond-mat/0702262
dc.identifierhttp://arxiv.org/abs/cond-mat/0702262
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/123740
dc.subjectMaterials Science
dc.titleRietveld refinement of ZrSiO4: application of a phenomenological model of anisotropic peak width
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