Beam Test Results of the BTeV Silicon Pixel Detector

Chiodini, G.; Appel, J. A.; Artuso, M.; Butler, J. N.; Cardoso, G.; Cheung, H.; Christian, D. C.; Colautti, A.; Coluccia, R.; Di Corato, M.; Gottschalk, E. E.; Hall, B. K.; Hoff, J.; Kasper, P. A.; Kutschke, R.; Kwan, S. W.; Mekkaoui, A.; Menasce, D.; Newsom, C.; Sala, S.; Yarema, R.; Wang, J. C.; Zimmermann, S.

Beam Test Results of the BTeV Silicon Pixel Detector

Authors

Description

The results of the BTeV silicon pixel detector beam test carried out at Fermilab in 1999-2000 are reported. The pixel detector spatial resolution has been studied as a function of track inclination, sensor bias, and readout threshold.
8 pages of text, 8 figures, Proceedings paper of Pixel 2000: International Workshop on Semiconductor Pixel Detectors for Particles and X-Rays, Genova, June 5-8, 2000