Beam Test Results of the BTeV Silicon Pixel Detector

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dc.creatorChiodini, G.
dc.creatorAppel, J. A.
dc.creatorArtuso, M.
dc.creatorButler, J. N.
dc.creatorCardoso, G.
dc.creatorCheung, H.
dc.creatorChristian, D. C.
dc.creatorColautti, A.
dc.creatorColuccia, R.
dc.creatorDi Corato, M.
dc.creatorGottschalk, E. E.
dc.creatorHall, B. K.
dc.creatorHoff, J.
dc.creatorKasper, P. A.
dc.creatorKutschke, R.
dc.creatorKwan, S. W.
dc.creatorMekkaoui, A.
dc.creatorMenasce, D.
dc.creatorNewsom, C.
dc.creatorSala, S.
dc.creatorYarema, R.
dc.creatorWang, J. C.
dc.creatorZimmermann, S.
dc.date2000-09-07
dc.date.accessioned2026-07-07T11:30:11Z
dc.date.available2026-07-07T11:30:11Z
dc.descriptionThe results of the BTeV silicon pixel detector beam test carried out at Fermilab in 1999-2000 are reported. The pixel detector spatial resolution has been studied as a function of track inclination, sensor bias, and readout threshold.
dc.description8 pages of text, 8 figures, Proceedings paper of Pixel 2000: International Workshop on Semiconductor Pixel Detectors for Particles and X-Rays, Genova, June 5-8, 2000
dc.identifierhttps://arxiv.org/abs/hep-ex/0009023
dc.identifierhttp://arxiv.org/abs/hep-ex/0009023
dc.identifierNucl.Instrum.Meth.A465:125-130,2000
dc.identifierdoi:10.1016/S0168-9002(01)00369-2
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/196940
dc.subjectHigh Energy Physics - Experiment
dc.titleBeam Test Results of the BTeV Silicon Pixel Detector
dc.typetext

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