Signature of Martensite transformation on conductivity noise in thin films of NiTi shape memory alloys

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Slow time-dependent fluctuations, or noise, in the electrical resistance of dc magnetron sputtered thin films of Nickel Titanium shape memory alloys have been measured. Even in equilibrium, the noise was several orders of magnitude larger than that of simple diffusive metallic films, and was found to be non-monotonic around the martensitic transformation regime. The results are discussed in terms of dynamics of structural defects, which also lay foundation to a new noise-based characterization scheme of martensite transformation.
4 pages, 3 figures

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Other Condensed Matter, Strongly Correlated Electrons

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http://salesiana.dossiersoluciones.com/handle/123456789/172991

Consulte el texto completo en el siguiente enlace:

https://arxiv.org/abs/0811.0101
 http://arxiv.org/abs/0811.0101
 Applied Physics Letters, 92, 112110 (2008)
 doi:10.1063/1.2896304

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arXiv