Signature of Martensite transformation on conductivity noise in thin films of NiTi shape memory alloys

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dc.creatorU, Chandni.
dc.creatorGhosh, Arindam
dc.creatorVijaya, H. S.
dc.creatorMohan, S.
dc.date2008-11-01
dc.date.accessioned2026-07-07T10:14:45Z
dc.date.available2026-07-07T10:14:45Z
dc.descriptionSlow time-dependent fluctuations, or noise, in the electrical resistance of dc magnetron sputtered thin films of Nickel Titanium shape memory alloys have been measured. Even in equilibrium, the noise was several orders of magnitude larger than that of simple diffusive metallic films, and was found to be non-monotonic around the martensitic transformation regime. The results are discussed in terms of dynamics of structural defects, which also lay foundation to a new noise-based characterization scheme of martensite transformation.
dc.description4 pages, 3 figures
dc.identifierhttps://arxiv.org/abs/0811.0101
dc.identifierhttp://arxiv.org/abs/0811.0101
dc.identifierApplied Physics Letters, 92, 112110 (2008)
dc.identifierdoi:10.1063/1.2896304
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/172991
dc.subjectOther Condensed Matter
dc.subjectStrongly Correlated Electrons
dc.titleSignature of Martensite transformation on conductivity noise in thin films of NiTi shape memory alloys
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