Conductance fluctuations near Anderson transition

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In this paper we report measurements of conductance fluctuations in single crystal samples of Si doped with P and B close to the critical composition of the metal insulator transition (n_c \approx 4 x 10^18 /cc). The measurements show that the noise, which arises from bulk sources, does not diverge as the Ioffe-Regal limit (k_{F}l -> 1) is approached from the metallic side. At room temperatures, the magnitude of the noise shows a shallow maximum around k_{F}l \approx 1.5 and drops sharply as the insulating state is approached.
8 pages of text in preprint form and 4 eps figures

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