Conductance fluctuations near Anderson transition

dc.creatorGhosh, Arindam
dc.creatorRaychaudhuri, A. K.
dc.date1999-06-07
dc.date.accessioned2026-07-07T03:13:38Z
dc.date.available2026-07-07T03:13:38Z
dc.descriptionIn this paper we report measurements of conductance fluctuations in single crystal samples of Si doped with P and B close to the critical composition of the metal insulator transition (n_c \approx 4 x 10^18 /cc). The measurements show that the noise, which arises from bulk sources, does not diverge as the Ioffe-Regal limit (k_{F}l -> 1) is approached from the metallic side. At room temperatures, the magnitude of the noise shows a shallow maximum around k_{F}l \approx 1.5 and drops sharply as the insulating state is approached.
dc.description8 pages of text in preprint form and 4 eps figures
dc.identifierhttps://arxiv.org/abs/cond-mat/9906088
dc.identifierhttp://arxiv.org/abs/cond-mat/9906088
dc.identifier.urihttp://salesiana.dossiersoluciones.com/handle/123456789/29374
dc.subjectDisordered Systems and Neural Networks
dc.subjectStrongly Correlated Electrons
dc.titleConductance fluctuations near Anderson transition
dc.typetext

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