Single Event Effects in the Pixel readout chip for BTeV

Chiodini, G.; Appel, J. A.; Cardoso, G.; Christian, D. C.; Coluccia, M. R.; Hoff, J.; Kwan, S. W.; Mekkaoui, A.; Yarema, R.; Zimmermann, S.

Single Event Effects in the Pixel readout chip for BTeV

Authors

Description

In future experiments the readout electronics for pixel detectors is required to be resistant to a very high radiation level. In this paper we report on irradiation tests performed on several preFPIX2 prototype pixel readout chips for the BTeV experiment exposed to a 200 MeV proton beam. The prototype chips have been implemented in commercial 0.25 um CMOS processes following radiation tolerant design rules. The results show that this ASIC design tolerates a large total radiation dose, and that radiation induced Single Event Effects occur at a manageable level.
15 pages, 6 Postscript figures