Statistics and noise in a quantum measurement process

Makhlin, Yuriy; Schoen, Gerd; Shnirman, Alexander

Statistics and noise in a quantum measurement process

Authors

Makhlin, Yuriy

Schoen, Gerd

Shnirman, Alexander

Description

The quantum measurement process by a single-electron transistor or a quantum point contact coupled to a quantum bit is studied. We find a unified description of the statistics of the monitored quantity, the current, in the regime of strong measurement and expect this description to apply for a wide class of quantum measurements. We derive the probability distributions for the current and charge in different stages of the process. In the parameter regime of the strong measurement the current develops a telegraph-noise behavior which can be detected in the noise spectrum.
4 pages, 2 figures